• CBM08AD1500QP

    CBM08AD1500QP

    CBM08AD1500 is made by CMOS process A semiconductor integrated circuit. This product combines folding and interpolation The circuit contains sample/hold amplifier

    and folding Amplifier, bandgap voltage reference, clock circuit and LVDS output Etc. The circuit is packaged in a 128 lead four sided flat shell(TQFP128), overall dimension is 22mm × 22mm × 2mm, in accordance with GJB597A-1996.The product features high sampling rate, low power consumption, small linear error Automatic gain and offset correction and 3- wire interface control.Gain, offset and connection of internal circuit can be realized through 3-wire interface The clock matching between channels is used for correction, and the analog input is differential input,Either AC coupling or DC coupling; Clock input circuit internal With DC offset, AC coupling input is required. This product is compatible with foreign National Semiconductor companies The ADC08D1500 pins of the company’s products are arranged in the same way, with the same function and performance It can directly replace ADC08D1500.

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  • CBM96AD56-125,Corebai

    CBM96AD56-125,Corebai

    The CBM96AD56-125 is a quad, 16-bit, 125 MSPS analog-to-digital converter (ADC) with an on-chip sample and hold circuit designed for low cost, low power, small size, and ease of use. The device operates at a conversion rate of up to 125 MSPS and is optimized for outstanding dynamic performance and low power in applications where a small package size is critical. The ADC requires a single 1.8 V power supply and LVPECL-/ CMOS-/LVDS-compatible sample rate clock for full performance operation. An external reference or driver components are not required for many applications. Individual channel power-down is supported and typically consumes less than 14 mW when all channels are disabled. The ADC contains several features designed to maximize flexibility andminimize system cost, such as a programmable output clock, data alignment, and digital test pattern generation. The available digital test patterns include built-in deterministic and pseudorandom patterns, along with custom user-defined test patterns entered via the serial port interface (SPI).

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